Equipment Highlight

TEM/STEM - Tecnai F20 (FEI)
The FEI Tecnai F20 is equipped with a differentially pumped environmental cell for in situ studies of gas-solid reaction kinetics and mechanisms. This system can handle gas pressures up to 10 torr,...
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X-ray Topography (Rigaku XRT-100)
X-ray topography (XRT) is a diffraction method used to map lattice defects and strain in single crystals, typically wafers, on the micrometer level. XRT is a simple and  non destructive method...
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TEM/STEM - ARM200F (JEOL)
The ARM200F is an aberration corrected STEM equipped with both an x-ray spectrometer and a special, newly developed electron spectrometer, with ultra-fast EELS that allows atomic level mapping....
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TEM/STEM - 2010F (JEOL)
The 2010 F is equipped with thin-window light-element-sensitive X-ray detector and a Gatan Enfina energy-loss spectrometer for high spatial resolution microanalysis. The microscope can be operated...
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Focused Ion Beam - Nova 200 NanoLab (FEI)
The Nova NanoLab brings advanced capabilities and flexibility to researchers and developers needing to create, modify, and characterize complex structures below 100 nanometers. It combines ultra-...
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LeRoy Eyring Center for Solid State Science

The LeRoy Eyring Center for Solid State Science provides advanced capabilities for materials analysis and characterization. Our facilities are supported by a dedicated staff with a commitment to client engagement.  The Center's instruments are available to the entire ASU research community and to government and industrial users across the country.