Equipment Spotlight

Focused Ion Beam - Nova 200 NanoLab (FEI)
The Nova NanoLab brings advanced capabilities and flexibility to researchers and developers needing to create, modify, and characterize complex structures below 100 nanometers. It combines ultra-...
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TEM/STEM - ARM200F (JEOL)
The ARM200F is an aberration corrected STEM equipped with both an x-ray spectrometer and a special, newly developed electron spectrometer, with ultra-fast EELS that allows atomic level mapping....
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TEM/STEM - 2010F (JEOL)
The 2010 F is equipped with thin-window light-element-sensitive X-ray detector and a Gatan Enfina energy-loss spectrometer for high spatial resolution microanalysis. The microscope can be operated...
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SEM - XL30 Environmental FEG (FEI)
The XL30 ESEM-FEG offers high resolution secondary electron imaging at pressures as high as 10 Torr and sample temperatures as high as 1,000°C. This means that wet, oily, dirty, outgassing, and non-...
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Nion UltraSTEM 100
The Nion UltraSTEMTM 100 is an aberration corrected STEM that offers sub-angstrom resolution at both 100 keV and 60 keV.  A special monochromater newly developed for ASU offers ultra-fast...
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Electron Microprobe
Our new JEOL JXA-8530F Hyperprobe features a field emission electron gun and a wavelength dispersive X-ray spectrometer (WDS). The FE electron gun produces an extremely small spot size at low voltage...
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Raman Spectrometer
  The micro-Raman spectrometer uses a 532nm laser to measure the sample. The information provided by Raman spectra are similar to that provided by FT-IR and result from an interaction...
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High Resolution X-ray Diffractometer (PANALYTICAL X’PERT PRO)
Diffractometer for thin films, single crystals and powders from room temperature up to 900°C using CuKα radiations. (LEFT: The PANalytical X’Pert Pro Materials Research X-ray Diffractometer)...
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Optical and Stylus Profilometer
Profilometry is a technique used to determine the topography of a surface and in some case measure stop height to determine film thickness. The vertical resolution is comparable to that of an AFM...
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X-ray Topography (Rigaku XRT-100)
X-ray topography (XRT) is a diffraction method used to map lattice defects and strain in single crystals, typically wafers, on the micrometer level. XRT is a simple and  non destructive method...
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X-ray Photoelectron Spectroscopy (XPS)
X-ray photoelectron spectroscopy (XPS), also referred to as electron spectroscopy for chemical analysis (ESCA), is a sensitive technique for investigating the elemental composition and the...
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LeRoy Eyring Center for Solid State Science

ASU's LeRoy Eyring Center provides advanced capabilities for materials analysis and characterization.  Our facilities are supported by a dedicated staff with a commitment to student / client engagement and training.  The Center's instruments are available to the entire ASU research community and to academic, government and industrial users across the country.