Leadership in Materials Characterization and Imaging
Arizona State University's LeRoy Eyring Center was established in 1974 to provide researchers with open access to sophisticated techniques for materials characterization and high resolution electron microscopy. The Center supports materials analysis across a broad range of scientific disciplines, including physics, chemistry, biological sciences, geology and engineering.
LE-CSSS has a four-decade legacy of training researchers on our electron microscopes and other analytical tools. Today, material scientists who trained at ASU are now running analytical, characterization and imaging laboratories in academia, government and industry around the world.
In 1988 LE-CSSS expanded the ASU mission to engage in education, open research and public service by providing industrial users with access to our instruments using a service-center model. Over the past 25 years, we have actively supported materials characterization and imaging requirements of corporate R&D in microelectronics, aerospace, medical electronics, energy, personal care, automotive, life sciences and other industries.
LE-CSSS is also committed to STEM-based educational outreach. ASU Science is Fun reaches thousands of K-12 students each year with programs designed to stimulate interest in science.
LE-CSSS is organized around three investigational areas:
John M. Cowley Center for High Resolution Electron Microscopy
Mr. Karl Weiss - Manager
As a global leader in high resolution electron microscopy, ASU plays an important role characterizing critical properties of materials. This facility houses a dozen electron microscopes that can probe the physical, electronic and chemical structure of matter on an atomic scale. Instruments & techniques include Scanning Electron Microscopy; Transmission Electron Microscopy; Scanning Transmission Electron Microscopy; and Aberration Corrected Electron Microscopy.
Goldwater Materials Science Facility
Dr. Emmanuel Soignard - Manager
The Goldwater Materials Science facility provides an extensive array of analytical tools and techniques for optical, structural and surface analysis; surface morphology, chemistry & microscopy; and synthesis & processing. Widely used techniques include X-ray Diffraction & Topography; Atomic Force Microscopy; FT-IR and Raman Spectroscopy; Auger and X-ray Photoelectron Spectroscopy; Optical & Stylus Profilometry; Residual Gas Analysis; Ellipsometry; and Thin film synthesis.
Ion Beam Analysis of Materials (IBeAM) Facility
Mr. Barry Wilkens - Manager
The IBeAM facility uses MeV ion beams to probe the elemental compositional and structural properties of materials. The process combines the advantages of non-destructive and standardless analysis of the surface and near surface regions of solids and liquids. Techniques include Rutherford Backscattering; Proton-Induced X-ray Emission; and X-ray Fluorescence.
All manuscripts which have used LE-CSSS equipment/staff time must include the following acknowledgement:
"We gratefully acknowledge the use of facilities with the LeRoy Eyring Center for Solid State Science at Arizona State University."