Home / Equipment / ARM200F (JEOL)


Manuel Roldan Gutierrez
Associate Research Scientist

Dan Thompson
Contact for Industry, Tech Marketing and Sales Coordinator


The ARM200F is an aberration corrected STEM equipped with both an x-ray spectrometer and a special, newly developed electron spectrometer, with ultra-fast EELS that allows atomic level mapping.  The instrument is part of ASU's Southwestern Center for Aberration Corrected Electron Microscopy.  The ARM200F offers resolution of 0.8 Angstrom at 200kV, 120kV and 80Kv   The JEOL ARM is also equipped to perform tomographic imaging, a technique often used for research in medical technology.

The ARM 200 is equipped with a Schottky field emission gun and a CEOS CESCOR hexapole aberration corrector that enables imaging resolution of 78 picometers, and beam current densities of 8 nanoamps per square nanometer. It is equipped with a JEOL 50 square millimeter (0.3 St.) windowless light-element-sensitive X-ray detector and a Gatan Enfinium EELS (Electron Energy Loss) spectrometer for high spatial resolution, high sensitivity microanalysis. This exclusive spectrometer can acquire one thousand 2,000 channel spectra per second in dual EELS mode covering a range of over 3,500 electron volts.

The microscope can be operated in high angle and medium angle annular dark-field STEM modes as well as brightfield and annular brightfield modes. It is also equipped with a Gatan slow scan CCD camera for recording high resolution, high S/N TEM images with 1.9Å Scherzer resolution and a Gatan Orius CCD cameras for recording electron diffraction patterns. There is a 64 bit, 32 GB computer for recording large data set 4D diffraction images. Specimen holders allow basic single tilt, low background double tilt, and tomography with a 75 degree tilt range.


Here are links to two posters illustrating the ARM's capability to perform precession_electron_diffraction and strain_mapping using a powerful analytical tool called Topspin.



  • Imaging Modes: STEM HAADF, MAADF, BF, ABF and TEM
  • Accelerating Voltage: 200, 120 and 80 KV
  • Cs: Sub micron STEM, : 0.5mm TEM,
  • Resolution: 78 picometers STEM,  0.19nm Scherzer
  • Focused Probe: sub angstrom
  • Source: Schottky Field Emission
  • Tilt Range: ± 15° imaging, ±75° tomography

Ancillary Equipment

  • Orius and Ultrascan CCD cameras.
  • Enfinium EELS spectrometer
  • Windowless high solid angle (50 square millimeter) X-Ray Detector
  • Single-Tilt, Double-Tilt and Tomography Holders
  • 64 bit Gatan Digital micrograph and Diffraction Imaging



Cost for ASU Internal Cost for ASU Internal with Staff Assistance Cost for Other Academic/Non-Profit Cost for Other Academic/Non-Profit with Staff Assistance
$65 $100 $130 $205

Training Requirements

All training is currently being scheduled by Karl Weiss, Karl.Weiss@asu.edu (480)965-3831

Note: All users must attend the ASU Lab Safety and Fire Safety courses prior to using any CHREM facility.


Emergency Information

See ASU Emergency Procedures and Information for emergency procedures for any of the following: Personal Threat or Assault, Power Outage, Major Accidents, Flooding, Hazardous Materials Incident, Radiation Spills, Biological Spills, Suspicious Packages, Natural Disaster & Inclement Weather, Bomb Threat, Evacuation, Medical Emergency, Personal Injury, and Fire.

Emergency Phone Numbers

In an emergency, dial 911 from any campus or other phone.

Call the General ASU Emergency Information Phone at 7-9911 (on-campus phone) or 480-727-9911 or toll-free 877-278-2785 (877-ASU-ASU5) to get a recorded message. For non-emergencies, The ASU Department of Public Safety office can be reached at 5-3465 (on-campus phone) or 480-965-3465.

Users must attend the ASU Lab Safety and Fire Safety courses prior to using any LE-CSSS facility.


More Information


Active users can schedule time using their iLab account with the following link: TEM/STEM - ARM200F Schedule

If you are not currently in iLab please click on the following link: iLab registration

  • Reserving time on an instrument means that you agree to pay for the entire time reserved at the standard rate whether you use it or not. This policy ensures the efficient use of instrumentation and discourages researchers from blocking up time that they are not going to use. You will also be billed for any time used that exceeds your reservation.

Access Policies: 

The Center for High Resolution Electron Microscopy is organized to provide easy access to instruments by campus-wide ASU researchers. Facility use is a telephone call or e-mail message away.

Although emphasis is placed on accommodating internal (ASU) researchers, all appropriate users, including industrial and educational researchers, are welcome.

Most samples can be accommodated in CHREM microscopes. The exception may be those that are particularly hazardous to human health. No radioactive samples, and the sample must survive in a vacuum and under the electron beam.