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Techniques

All techniques are listed below. Click on the title for more information, including a list of our equipment that uses each technique.

Technique Description Location
Aberration Corrected TEM / STEM

ASU's Center for Aberration Corrected Electron Microscopy (ACEM) provides researchers with unrivaled capability to understand the behavior...

John M. Cowley Center for High Resolution Electron Microscopy
FIB & Sample Prep

FIB: Dual beam; ion beam and SEM for milling samples; TEM sample pret; deposition and imaging of samples.

Sample...

John M. Cowley Center for High Resolution Electron Microscopy
High pressure Synthesis

Large volume presses including Piston cylinders, multi-anvils and auxiliary tools to synthesize sample at pressures >20 GPa and >2000°C....

Goldwater Materials Science Facility
IBeAM

Ion beam analysis (IBA): using MeV ion beams for compositional and structural determination of materials, combines the advantages...

Ion Beam Analysis of Materials (IBeAM) Facility
Materials Processing & Calorimetry

The Chemistry facility includes a broad range of furnaces with customizable gas flows and setups, glove boxes, fumehoods, thermal analysis...

Goldwater Materials Science Facility
Microprobe

Wavelength Dispersive Spectroscopy (WDS); Energy Dispersive Spectroscopy (EDS); microanalysis; surface composition; and mapping;...

John M. Cowley Center for High Resolution Electron Microscopy
Optical Spectroscopy

Optical spectroscopy uses light in the UV, visible or infrared to determine physical, chemical or structural properties of materials. The...

Goldwater Materials Science Facility
SEM

Surface topography, spatially-resolved composition using Energy Dispersive Spectroscopy (EDS).

John M. Cowley Center for High Resolution Electron Microscopy
Surface Composition & Film Deposition

Surface analysis by XPS or AES and thin film deposition by PVD are available.

Goldwater Materials Science Facility
Surface Imaging

The Center has several tools to image surfaces besides the electron microscopy techniques. Scanning probes instruments utilize a small tip to...

Goldwater Materials Science Facility
TEM / STEM

TEM (Transmission Electron Microscope): Imaging of atomic structure, including defects, nanometer-scale selected area diffraction...

John M. Cowley Center for High Resolution Electron Microscopy
X-ray Diffraction

X-ray diffraction is typically used for phase identification and composition; crystal structure; crystal quality; orientation; strain state;...

Goldwater Materials Science Facility
X-ray fluorescence

Technique used to determine bulk composition of solid and liquid materials

Goldwater Materials Science Facility