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FIB: Dual beam; ion beam and SEM for milling samples; TEM sample pret; deposition and imaging of samples.
Sample Preparation: Many samples need to be processed before being looked at in the SEM or the TEM. Our Sample Prep room is designed to process samples for both the SEM (cutting and grinding and polishing) and the TEM (cutting, grinding, dimpling, wedge polishing, ion milling). In addition we can coat the sample with Gold, Gold/Palladium or Carbon to eliminate charging in the SEM and TEM.
|Focused Ion Beam - Nova 200 NanoLab (FEI)||
The Nova NanoLab brings advanced capabilities and flexibility to researchers and developers needing to create, modify, and characterize complex...
|John M. Cowley Center for High Resolution Electron Microscopy (PSB B54F)|