SEM

Surface topography, spatially-resolved composition using Energy Dispersive Spectroscopy (EDS).

Related Equipment

Equipment Description Facility
XL30 Environmental FEG (FEI)

The XL30 ESEM-FEG offers high resolution secondary electron imaging at pressures as high as 10 Torr and sample temperatures as high as 1,000°C.

John M. Cowley Center for High Resolution Electron Microscopy (PSB 54I)
SNE-4500M table top SEM

The SNE-4500M Plus is a scanning electron microscope (SEM) for observing the surface topography of a specimen and Analytical determinations using...

John M. Cowley Center for High Resolution Electron Microscopy (PSB 54D)