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Surface topography, spatially-resolved composition using Energy Dispersive Spectroscopy (EDS).
|XL30 Environmental FEG (FEI)||
The XL30 ESEM-FEG offers high resolution secondary electron imaging at pressures as high as 10 Torr and sample temperatures as high as 1,000°C.
|John M. Cowley Center for High Resolution Electron Microscopy (PSB 54I)|
|SNE-4500M table top SEM||
The SNE-4500M Plus is a scanning electron microscope (SEM) for observing the surface topography of a specimen and Analytical determinations using...
|John M. Cowley Center for High Resolution Electron Microscopy (PSB 54D)|
|JEOL JSM6300 SEM (Bio)||
The JEOL 6300 SEM is fitted with a IXRF digital acquisition system and is equipped with a LaB6 filament. Operation range is 1-30 kV
|Life Science Electron Microscopy (LSC L2-34)|