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Surface Composition & Film Deposition

Surface analysis by XPS or AES and thin film deposition by PVD are available.

Related Equipment

Equipment Description Facility
Auger Electron Spectroscopy (AES)

Auger Electron Spectroscopy (AES) determines the elemental composition of surfaces with a sensitivity of ~0.1 atomic percent. Depth profiling can...

Goldwater Materials Science Facility (GWC B10)
X-ray Photoelectron Spectroscopy (VG 220i-XL)

XPS provides elemental composition and chemical bonding information on the sample’s first few atomic layers. XPS is also refered to as Electron...

Goldwater Materials Science Facility (GWC B10)
Film Deposition

Thin film deposition can be performed using the following physical vapor deposition methods: RF/DC sputter deposition, electron beam evaporation,...

Goldwater Materials Science Facility (GWC B10)