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Surface Imaging

The Center has several tools to image surfaces besides the electron microscopy techniques. Scanning probes instruments utilize a small tip to determine surface topography and other information on the nm latteral scale for very flat surfaces. Stylus profilometry scans a multi micron size diamond tip across the surface to measure topography. Optical profilometry uses white light interferometry to generate a 3D picture of the surface in a few seconds.

Related Equipment

Equipment Description Facility
Optical Profilometer (ZeScope)

Optical profilometry uses white light interferometry to generate a 3D image of the sample surface with a height resolution better than 1Å.

Goldwater Materials Science Facility (GWC B26D)
Stylus Profilometer (Bruker Dektak XT)

A diamond tip stylus is in contact with the sample surface. The sample and sample stage are moved laterally as the tip translates vertically to...

Goldwater Materials Science Facility (GWC B26D)
Scanning Probe/ Atomic force Microscopy (SPM/AFM)

Surface Probe Microscopy, SPM, consists of a family of modes which monitor the interaction between a very sharp tip and the sample surface to...

Goldwater Materials Science Facility (PSB 36)