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X-ray Diffraction

X-ray diffraction is typically used for phase identification and composition; crystal structure; crystal quality; orientation; strain state; crystal chemistry and defect density; surface quality; film thickness; sample texture. The typical samples are thin films (both single crystal and polycrystaline) as well as powders.

Related Equipment

Equipment Description Facility
High Resolution X-ray Diffractometer (PANalytical X'Pert PRO MRD)

Diffractometer for thin films  both single crystals and polycrystalline (diffraction & XRR) from RT to 900°C, also used to measure powders.

Goldwater Materials Science Facility (GWC B2)
X-ray topography (Rigaku XRT-100)

XRT is a non destructive diffraction method used to map lattice defects and strain in single crystals on the millimeter to micrometer scale.

Goldwater Materials Science Facility (GWC B4)
Powder X-ray Diffractometer (Siemens D5000)

The D-5000 is a basic powder diffractometer well suited for the analysis of strongly scattering powder samples and qualitative analysis.

Goldwater Materials Science Facility (GWC B2)
Powder X-ray diffractometer (Siemens D5000 PSC)

The Siemens D5000 X-Ray Diffractometer is used mainly for collecting fast data used in identifying unknown solid powders.

Goldwater Materials Science Facility (PSC-8)
Single Crystal X-ray diffractometer (Bruker Smart APEX)

Full structural analysis of single crystal (10-500μm) from room temperature to 120K

Goldwater Materials Science Facility (PSC-10)
Powder X-ray diffractometer (Bruker D8)

The D8 Advance Diffractometer has many specialized diffraction capabilities. Multiple stages and incident setup availlable.

Goldwater Materials Science Facility (PSC-3)